Forbes Advanced XRF Workshop

Tuesday and Wednesday September 10-11, 2013

The International Gallery of the Smithsonian Institution.

http://handheldxrf.eventbrite.com/

The purpose of the free workshop is to provide participants with advanced knowledge of the physics of X-ray fluorescence (XRF) and how to apply this technique to elemental analysis. For further details and online registration visit:

The purpose of the workshop is to provide participants with advanced knowledge of the physics of X-ray fluorescence (XRF) and how to apply this technique to elemental analysis.

For both Tuesday and Wednesday, doors will open at 9am when coffee will be provided and the workshop will begin at 9:30 a.m. There will be breaks for lunch.  The workshop will wrap up at approximately 4 p.m. each day with time for further questions or analysis.

Learning will be accomplished by hands-on analysis of materials that participants bring to the workshop, and there will be opportunities for strengthening your calibrations by measurement of standards and reference materials participants are willing to share.  Please bring objects and standard/reference materials for analysis to enable a vibrant workshop.  XRF instruments will be available for the attendees to use and we encourage you to bring any XRF unit you have.  Instruments will be offered at the workshop and thereafter for 2 weeks for no cost or fee. Attendees will be provided with software for spectral evaluation and extensive documentation.

Please note in your registration if you will be bringing an instrument and you will be sent further information.

A person wearing gloves holds a TRACeR x-ray florescence spectrometer against a painted surface.
Handheld x-ray florescence spectrometry on a Fayum portrait